Publikationen von Ullrich Pietsch

Shokr, M.; Kirchlechner, C.; Malyar, N. V.; Ariunbold, U.; Hartmann, R.; Strueder, L. W.; Genzel, C.; Klaus, M.; Pietsch, U.: In situ observations of single grain behavior during plastic deformation in polycrystalline Ni using energy dispersive Laue diffraction. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing 772, 138778 (2020)

Abboud, A.; Kirchlechner, C.; Kečkéš, J.; Çonka-Nurdan, T.; Send, S.; Micha, J.-S.; Ulrich, O.; Hartmann, R.; Strüderf, L.; Pietsch, U.: Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a twodimensional energy-dispersive detector. Journal of Applied Crystallography 50 (3), S. 901 - 908 (2017)

Abboud, A.; Kirchlechner, C.; Send, S.; Micha, J.-S.; Ulrich, O.; Pashniak, N.; Strüder, L. W.; Kečkéš, J.; Pietsch, U.: A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device. Review of Scientific Instruments 85 (11), 113901 (2014)