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Zeitschriftenartikel (6)

  1. 1.
    Zeitschriftenartikel
    Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Chatain, D.; Dehm, G.; Scheu, C.: On pinning-depinning and microkink-flow in solid state dewetting: Insights by in-situ ESEM on Al thin films. Acta Materialia 165, S. 153 - 163 (2019)
  2. 2.
    Zeitschriftenartikel
    Budak, Ö.; Srimuk, P.; Tolosa, A.; Fleischmann, S.; Lee, J.; Hieke, S. W.; Frank, A.; Scheu, C.; Presser, V.: Vanadium (III) Oxide/Carbon Core/Shell Hybrids as an Anode for Lithium‐Ion Batteries. Batteries & Supercaps 2 (1), S. 74 - 82 (2019)
  3. 3.
    Zeitschriftenartikel
    Hieke, S. W.; Dehm, G.; Scheu, C.: Annealing induced void formation in epitaxial Al thin films on sapphire (α-Al2O3). Acta Materialia 140, S. 355 - 365 (2017)
  4. 4.
    Zeitschriftenartikel
    Toparli, C.; Hieke, S. W.; Altin, A.; Kasian, O.; Scheu, C.; Erbe, A.: State of the Surface of Antibacterial Copper in Phosphate Buffered Saline. Journal of the Electrochemical Society 164 (12), S. H734 - H742 (2017)
  5. 5.
    Zeitschriftenartikel
    Hieke, S. W.; Breitbach, B.; Dehm, G.; Scheu, C.: Microstructural evolution and solid state dewetting of epitaxial Al thin films on sapphire (α-Al2O3). Acta Materialia 133, S. 356 - 366 (2017)
  6. 6.
    Zeitschriftenartikel
    Raghavan, R.; Harzer, T. P.; Djaziri, S.; Hieke, S. W.; Kirchlechner, C.; Dehm, G.: Maintaining strength in supersaturated copper–chromium thin films annealed at 0.5 of the melting temperature of Cu. Journal of Materials Science 52 (2), S. 913 - 920 (2017)

Konferenzbeitrag (2)

  1. 7.
    Konferenzbeitrag
    Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire. In: Microscopy Conference 2017 (MC 2017) - Proceedings (Hg. Laue, M.). Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, 21. August 2017 - 25. August 2017. Universität Regensburg, Regensburg (2017)
  2. 8.
    Konferenzbeitrag
    Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. In: European Microscopy Congress 2016: Proceedings. The 16th European Microscopy Congress (EMC 2016), Lyon, France, 28. August 2016 - 02. September 2016. Wiley-VCH Verlag GmbH & Co KGaA (2016)

Vortrag (8)

  1. 9.
    Vortrag
    Frank, A.; Dias, M.; Hieke, S. W.; Kruth, A.; Scheu, C.: Electron microscopic investigation of the influence of plasma parameters on VOx films deposited by a plasma ion assisted process. E-MRS 2019 Spring Meeting, Nice, France (2019)
  2. 10.
    Vortrag
    Frank, A.; Hieke, S. W.; Dias, M.; Fleischmann, S.; Presser, V.; Kruth, A.; Scheu, C.: Transmission electron microscopy study of carbon/metal oxide hybrid materials for Energy Storage Application. 19th International Microscopy Congress IMC19, Sydney, Australia (2018)
  3. 11.
    Vortrag
    Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: Evolution of faceted voids and fingering instabilities in a model thin film system - Insights by in-situ environmental scanning electron microscopy. Symposium - In situ Microscopy with Electrons, X‐rays and Scanning Probes, Universität Erlangen‐Nürnberg, Erlangen, Germany (2017)
  4. 12.
    Vortrag
    Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire. 13th Multinational Congress on Microscopy, Rovinj, Croatia (2017)
  5. 13.
    Vortrag
    Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire. Microscopy Conference 2017 – Dreiländertagung (MC 2017), Lausanne, Switzerland (2017)
  6. 14.
    Vortrag
    Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. The 16th European Microscopy Congress (EMC 2016), Lyon, France (2016)
  7. 15.
    Vortrag
    Hieke, S. W.; Dehm, G.; Scheu, C.: Solid state dewetting of epitaxial Al thin films on sapphire studied by electron microscopy. Materials Research Society Fall Meeting & Exhibition 2016 (MRS Fall 2016), Boston, MA, USA (2016)
  8. 16.
    Vortrag
    Hieke, S. W.; Dehm, G.; Scheu, C.: Temperature induced faceted hole formation in epitaxial Al thin films on sapphire. Understanding Grain Boundary Migration: Theory Meets Experiment, Günzburg/Donau, Germany (2015)

Poster (6)

  1. 17.
    Poster
    Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Chatain, D.; Dehm, G.; Scheu, C.: In-situ observation of irregular void growth in Al thin films during solid state dewetting. 19th International Microscopy Congress (IMC19), Sydney, Australia (2018)
  2. 18.
    Poster
    Hieke, S. W.; Dehm, G.; Scheu, C.: Texture evolution and solid state dewetting of passivated Al thin films on Al2O3. International GRK 1896 Satellite Symposium "In Situ Microscopy with Electrons, X-rays and Scanning Probes", Erlangen, Germany (2017)
  3. 19.
    Poster
    Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. TEM-UCA: Transmission Electron Microscopy of Nanomaterials - European Summer Workshop (TEM-UCA 2015), Cádiz, Spain (2015)
  4. 20.
    Poster
    Hieke, S. W.; Dehm, G.; Scheu, C.: Electron microscopy investigation of solid state dewetted epitaxial Al thin films on sapphire. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices (IAMNano 2015), Hamburg, Germany (2015)
 
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