Publikationen von Christoph Kirchlechner

Wimmer, A. C.; Heinz, W.; Detzel, T.; Robl, W.; Nellessen, M.; Kirchlechner, C.; Dehm, G.: Cyclic bending experiments on freestanding Cu micron lines observed by EBSD. Acta Materialia 83, S. 460 - 469 (2015)

Cordill, M. J.; Marx, V. M.; Kirchlechner, C.: Ductile film delamination from compliant substrates using hard overlayers. Thin Solid Films 571 (P2), S. 302 - 307 (2014)

Abboud, A.; Kirchlechner, C.; Send, S.; Micha, J.-S.; Ulrich, O.; Pashniak, N.; Strüder, L. W.; Kečkéš, J.; Pietsch, U.: A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device. Review of Scientific Instruments 85 (11), 113901 (2014)

Vaxelaire, N.; Labat, S.; Cornelius, T. W.; Kirchlechner, C.; Kečkéš, J.; Schulli, T. U.; Thomas, O.: New insights into single-grain mechanical behavior from temperature-dependent 3-D coherent X-ray diffraction. Acta Materialia 78, S. 46 - 55 (2014)

Imrich, P. J.; Kirchlechner, C.; Motz, C.; Dehm, G.: Differences in deformation behavior of bicrystalline Cu micropillars containing a twin boundary or a large-angle grain boundary. Acta Materialia 73, S. 240 - 250 (2014)

Glushko, O.; Marx, V. M.; Kirchlechner, C.; Zizak, I.; Cordill, M. J.: Recovery of electrical resistance in copper films on polyethylene terephthalate subjected to a tensile strain. Thin Solid Films 552 (3), S. 141 - 145 (2014)

Schmoelzer, T.; Liss, K. D.; Kirchlechner, C.; Mayer, S.; Stark, A.; Peel, M.; Clemens, H.: An in-situ high-energy X-ray diffraction study on the hot-deformation behavior of a beta-phase containing TiAl alloy. Intermetallics 39, S. 25 - 33 (2013)

Barabash, R. I.; Kirchlechner, C.; Robach, O.; Ulrich, O.; Micha, J. S.; Sozinov, A.; Barabash, O. M.: In-situ observation of stress-induced stochastic twin boundary motion in off stoichiometric NiMnGa single crystals. Applied Physics Letters 103 (2), S. 021909-1 - 021909-5 (2013)

Schlögl, M.; Kirchlechner, C.; Paulitsch, J.; Keckes, J.; Mayrhofer, P. H.: Effects of structure and interfaces on fracture toughness of CrN/AlN multilayer coatings. Scripta Materialia 68 (12), S. 917 - 920 (2013)

Kirchlechner, C.; Grosinger, W.; Kapp, M. W.; Imrich, P. J.; Micha, J.-S.; Ulrich, O.; Kečkéš, J.; Dehm, G.; Motz, C.: Investigation of reversible plasticity in a micron-sized, single crystalline copper bending beam by X-ray μLaue diffraction. Philosophical Magazine 92 (25-27), S. 3231 - 3242 (2012)

Kiener, D.; Zhang, Z.; Šturm, S.; Cazottes, S.; Imrich, P. J.; Kirchlechner, C.; Dehm, G.: Advanced nanomechanics in the TEM: Effects of thermal annealing on FIB prepared Cu samples. Philosophical Magazine 92 (25-27), 185, S. 3269 - 3289 (2012)

Kiener, D.; Zhang, Z.; Šturm, S.; Cazottes, S.; Imrich, P. J.; Kirchlechner, C.; Dehm, G.: Advanced nanomechanics in the TEM: effects of thermal annealing on FIB prepared Cu samples. Philosophical Magazine 92 (25-27), S. 3269 - 3289 (2012)

Moser, G.; Felber, H.; Rashkova, B.; Imrich, P. J.; Kirchlechner, C.; Grosinger, W.; Motz, C.; Dehm, G.; Kiener, D.: Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing. Praktische Metallographie-Practical Metallography 49 (6), S. 343 - 355 (2012)

Pippan, R.; Kolednik, O.; Rashkova, B.; Kirchlechner, C.; Kiener, D.; Dehm, G.: Tiefe Einblicke in die Strukturen. Kleine Zeitung Uni 30, S. 2 - 2 (2011)

Kirchlechner, C.; Kečkéš, J.; Motz, C.; Grosinger, W.; Kapp, M. W.; Micha, J.-S.; Ulrich, O.; Dehm, G.: Impact of instrumental constraints and imperfections on the dislocation structure in micron-sized Cu compression pillars. Acta Materialia 59 (14), S. 5618 - 5626 (2011)

Kirchlechner, C.; Kečkéš, J.; Micha, J.-S.; Dehm, G.: In Situ µLaue: Instrumental Setup for the Deformation of Micron Sized Samples. Advanced Engineering Materials 13 (8), S. 837 - 844 (2011)

Rester, M.; Fischer, F. D.; Kirchlechner, C.; Schmoelzer, T.; Clemens, H. J.; Dehm, G.: Deformation mechanisms in micron-sized PST TiAl compression samples: Experiment and model. Acta Materialia 59 (9), S. 3410 - 3421 (2011)

Kirchlechner, C.; Kiener, D.; Motz, C.; Labat, S.; Vaxelaire, N.; Perroud, O.; Micha, J.-S.; Ulrich, O.; Thomas, O.; Dehm, G. et al.; Kečkéš, J.: Dislocation storage in single slip-oriented Cu micro-tensile samples: New insights via X-ray microdiffraction. Philosophical Magazine 91 (7-9), S. 1256 - 1264 (2011)

Kirchlechner, C.; Martinschitz, K. J.; Daniel, R.; Mitterer, C.; Donges, J.; Rothkirch, A.; Klaus, M.; Genzel, C.; Kečkéš, J.: X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel. Scripta Materialia 62 (10), S. 774 - 777 (2010)

Vaxelaire, N.; Proudhon, H.; Labat, S.; Kirchlechner, C.; Kečkéš, J.; Jacques, V.; Ravy, S.; Forest, S.; Thomas, O.: Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction. New Journal of Physics 12, 035018, S. 1 - 12 (2010)