Poster
Schwarz, T.; Redinger, A.; Siebentritt, S.; Gault, B.; Raabe, D.; Choi, P.-P.: Increased detector efficiency helps to reveal new insights into compositional fluctuations at defects in Cu
2ZnSnSe
4 thin films. APT&M 2018, NIST, Gaithersburg, MD, USA (2018)