Publikationen von G. Dehm

Motz, C.; Kiener, D.; Kirchlechner, C.; Grosinger, W.; Pippan, R.; Dehm, G.: Advances in in-situ testing in scanning electron microscopes: probing mechanical properties at the nano/micro-scale. In: 10th Multinational Congress on Microscopy (MCM 2011), S. 57 - 58. 10th Multinational Congress on Microscopy (MCM 2011). (2011)

Cha, L.; Clemens, H. J.; Dehm, G.; Zhang, Z.: In-situ TEM heating study of the γ lamellae formation inside the α2 matrix of a Ti-45Al-7.5Nb alloy. 2010 International Conference on Advances in Materials and Manufacturing Processes, ICAMMP 2010;Code 83174, Shenzhen, China, 06. November 2010 - 08. November 2020. Advanced Materials Research 146-147, S. 1365 - 1368 (2011)

Clemens, H. J.; Schmoelzer, T.; Schloffer, M.; Schwaighofer, E.; Mayer, S.; Dehm, G.: Physical metallurgy and properties of β-solidifying TiAl based alloys. In: Materials Research Society symposium proceedings, Bd. 1295, S. 95 - 100. Materials Research Society Symposium N – Intermetallic-Based Alloys for Structural and Functional Applications , San Francisco, CA, USA, 25. April 2011 - 29. April 2011. Materials Research Society: MRS, Leoben, Austria (2011)

Dehm, G.; Kiener, D.: Obtaining a quantitative micro- and nano-mechanical understanding of metals using in situ electron microscopy. In: MCM 2011, S. 599 - 600. 10th Multinational Congress on Microscopy (MCM 2011), Urbino, Italy, 04. September 2011 - 09. September 2011. Urbino, Italy (2011)

Dehm, G.; Raj, R.; Rühle, M.: Measurement of the Interfacial Shear Strength of Thin Copper Films on Sapphire by Microindentation Experiments. In: Materials Research Symposium Proceedings 1996 (Symposium I – Polycrystalline Thin Films: Structure, Texture, Properties and Applications II), Bd. 403, S. 151 - 156. 1996 MRS Fall Meeting & Exhibit, Boston, MA, USA, 02. Dezember 1996 - 06. Dezember 1996. Materials Research Society, Boston, MA, USA (2011)

Kiener, D.; Kirchlechner, C.; Zhang, Z.; Ulrich, O.; Micha, J.-S.; Dehm, G.: Plasticity of FIB fabricated micro-samples investigated by in-situ micro-Laue diffraction and in-situ TEM. In: 10th Multinational Congress on Microscopy (MCM 2011), S. 129 - 130. 10th Multinational Congress on Microscopy (MCM 2011), Urbino, Italy , 04. September 2011 - 09. September 2011. (2011)

Huang, R.; Robl, W.; Dehm, G.; Ceric, H.; Detzel, T.: Disparate tendency of stress evolution of thin and thick electroplated Cu films at room temperature. In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, 5532222, S. 1 - 6. International Symposium on the Physical and Failure Analysis of Integrated Circuits IPFA 2010, Singapore, Singapore, 05. Juli 2010 - 09. Juli 2010. IEEE (2010)

Cordill, M. J.; Taylor, A. A.; Schalko, J.; Dehm, G.; Dehm, G.: Fracture and Delamination of Chromium Thin Films on Polymer Substrates. Symposium on Mechanical Behavior of Nanostructured Materials held at the 2009 TMS Annual Meeting and Exhibition, San Francisco, CA, USA, 15. Februar 2009 - 19. Februar 2009. Metallurgical and Materials Transactions A 41 (4), S. 870 - 875 (2010)

Yang, B.; Motz, C.; Grosinger, W.; Dehm, G.: Cyclic loading behavior of micro-sized polycrystalline copper wires. 10th International Fatigue Congress, FATIGUE 2010, Prague, Czech Republic, 06. Juni 2010 - 11. Juni 2010. Procedia Engineering 2 (1), S. 925 - 930 (2010)

Cazottes, S.; Zhang, Z.; Dehm, G.: A structural characterization of a Cu/MgO (001) interface using Cs corrected TEM. In: 9th Multinational Microscopy Conference 2009, Materials Science, Bd. 3, S. 69 - 70 (Hg. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Cazottes, S.; Zhang, Z.; Dehm, G.: A structural characterization of a Cu/MgO (001) interface using C_s corrected HRTEM. In: 9th Multinational Microscopy Conference 2009 (Hg. Kothleitner, G.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Cha, L.; Scheu, C.; Dehm, G.: A TEM study of ultra-fine lamellar structures in titanium aluminide. In: 9th Multinational Microscopy Conference 2009 Materials Science, Bd. 3, S. 247 - 248 (Hg. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Cha, L.; Scheu, C.; Dehm, G.; Schnitzer, R.; Clemens, H. J.: Initial stages of lamellae formation in high Nb containing γ-TiAl based alloys. In: Materials Research Society Symposium Proceedings 2009, Bd. 1128, S. 153 - 158. MRS Fall Meeting 2009, Boston, MA, USA, 30. November 2009 - 04. Dezember 2009. (2009)

Motz, C.; Kiener, D.; Kirchlechner, C.; Matoy, K.; Wurster, S.; Dehm, G.; Pippan, R.: Determination of micro-mechanical properties: In-situ compression, tension and fracture testing within the SEM. In: 9th Multinational Microscopy Conference 2009, S. 501 - 502 (Hg. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Rashkova, B.; Moser, G.; Felber, H.; Grosinger, W.; Zhang, Z.; Motz, C.; Dehm, G.: A Novel Preparation Route to Obtain Micro-Bending Beams for In-situ TEM Studies. In: Instrumentation and Methodology, Bd. 1, S. 249 - 250. 9th Multinational Microscopy Conference 2009, Institute for Electron Microscopy Graz, University of Technology , Graz, Austria, 30. August 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Rashkova, B.; Zhang, Z.; Šturm, S.; Kothleitner, G.; Kutschej, K.; Mitterer, C.; Lazar, P.; Redinger, J.; Podloucky, R.; Scheu, C. et al.; Dehm, G.: EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates. In: 9th Multinational Microscopy Conference 2009, S. 285 - 286 (Hg. Kothleitner, G.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2008. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Rester, M.; Cha, L.; Scheu, C.; Dehm, G.; Clemens, H. J.; Kothleitner, G.; Leisch, M.: Microstructure of a massively transformed high Nb containing γ-TiAl based alloy. In: 9th Multinational Microscopy Conference 2009, S. 231 - 232 (Hg. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Zhang, Z.; Rashkova, B.; Dehm, G.; Lazar, P.; Redinger, J.; Podloucky, R.: Atomic and electronic structural studies of VN/MgO (001) interface by an image-side C_s-corrected electron microscope. In: 9th Multinational Microscopy Conference 2009, S. 15 - 16 (Hg. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2009. (2009)

Kiener, D.; Jörg, T.; Rester, M.; Motz, C.; Dehm, G.: Conventional TEM Investigation of the FIB Damage in Copper. In: Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, S. 100 - 101. 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, Saarbrücken, Germany, 02. September 2007 - 07. September 2007. (2007)

Oh, S. H.; Legros, M.; Kiener, D.; Gruber, P. A.; Dehm, G.: Size-Induced Transition from Perfect to Partial Dislocation Plasticity in Single Crystal Au Films on Polyimide. In: Proceeding Microscopy 33rd Conference, Deutsche Gesellschaft für Elektronenmikroskopie, S. 278 - 279. Microscopy 33rd Conference, Deutsche Gesellschaft für Elektronenmikroskopie, Saarbrücken, Germany, 02. September 2007 - 07. September 2007. (2007)