Publikationen von Gerhard Dehm

Sauter, L. X.; Balk, T. J.; Dehm, G.; Nucci, J.; Arzt, E.: Hillock Formation and Thermal Stresses in Thin Au Films on Si Substrates. Materials Research Society Symposium Proceedings 875, O5.2, S. 177 - 182 (2005)

Wellner, P.; Dehm, G.; Kraft, O.; Arzt, E.: Size effects in the plastic deformation of NiAl thin films. Zeitschrift für Metallkunde 95 (9), S. 769 - 778 (2004)

Bischof, M.; Leitner, H.; Clemens, H.; Staron, P.; Dehm, G.; Voiticek, A.; Knabl, W.: Microstructure and mechanical properties of Si and YN doped powder metallurgical tantalum. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques 95 (7), S. 573 - 578 (2004)

Volkert, C. A.; Busch, S.; Heiland, B.; Dehm, G.: Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling. Journal of Microscopy 214 (3), S. 208 - 212 (2004)

Weller, M.; Clemens, H.; Haneczok, G.; Dehm, G.; Bartels, A.; Bystrzanowski, S.; Gerling, R. W.; Arzt, E.: Mechanical Spectroscopy of a High Nb Containing γ-TiAl Based Alloy with Near Gamma and Fully Lamellar Microstructure. Philosophical Magazine Letters 84 (6), S. 383 - 393 (2004)

Wellner, P.; Kraft, O.; Dehm, G.; Andersons, J.; Arzt, E.: Channel cracking of β-NiAl thin films on Si substrates. Acta Materialia 52 (8), S. 2325 - 2336 (2004)

Schmidt, T.; Balk, T. J.; Dehm, G.; Arzt, E.: Influence of tantalum and silver interlayers on thermal stress evolution in copper thin films on silicon substrates. Scripta Materialia 50 (6), S. 733 - 737 (2004)

Inkson, B. J.; Dehm, G.; Wagner, T. A.: Thermal stability of Ti and Pt nanowires manufactured by Ga⁺ focused ion beam. Journal of Microscopy 214 (3), S. 252 - 260 (2004)

Clemens, H.; Schubert, D. W.; Dehm, G.; Scheu, C.; Buttstaedt, J. L.: Characterization of biocompatible Ti(CNO) layers on polymeric substrates. Applied Surface Science 219 (3-4), S. 329 - 337 (2003)

Schwaiger, R.; Dehm, G.; Kraft, O.: Cyclic deformation of polycrystalline Cu films. Philosophical Magazine 83 (6), S. 693 - 710 (2003)

Dehm, G.; Bamberger, M. S.: Laser cladding of Co-based hardfacing on Cu substrate. Journal of Materials Science 37 (24), S. 5345 - 5353 (2002)

Dehm, G.; Inkson, B. J.; Wagner, T. A.: Growth and microstructural stability of epitaxial Al films on (0001) α-Al₂O₃ substrates. Acta Materialia 50 (20), S. 5021 - 5032 (2002)

Inkson, B. J.; Dehm, G.; Wagner, T. A.: In-situ TEM observation of dislocation motion in thermally strained Al nanowires. Acta Materialia 50 (20), S. 5033 - 5047 (2002)

Beschliesser, M.; Chatterjee, A.; Lorich, A.; Knabl, W.; Kestler, H.; Dehm, G.; Clemens, H.: Designed fully lamellar microstructures in a γ-TiAl based alloy: adjustment and microstructural changes upon long-term isothermal exposure at 700 and 800 degrees C. Materials Science and Engineering A-Structural Materials Properties Microstructure and Processing 329-331, S. 124 - 129 (2002)

Marketz, W. T.; Fischer, F. D.; Kauffmann, F.; Dehm, G.; Bidlingmaier, T.; Wanner, A.; Clemens, H.: On the role of twinning during room temperature deformation of γ-TiAl based alloys. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing 329-331, S. 177 - 183 (2002)

Dehm, G.; Balk, T. J.; von Blanckenhagen, B.; Gumbsch, P.; Arzt, E.: Dislocation dynamics in sub-micron confinement: recent progress in Cu thin film plasticity. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques 93 (5), S. 383 - 391 (2002)

Schillinger, W.; Clemens, H.; Dehm, G.; Bartels, A.: Microstructural stability and creep behavior of a lamellar γ-TiAl based alloy with extremely fine lamellar spacing. Intermetallics 10 (5), S. 459 - 466 (2002)

Bartels, A.; Clemens, H.; Dehm, G.; Lach, E.; Schillinger, W.: Strain rate dependence of the deformation mechanisms in a fully lamellar γ-TiAl-based alloy. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques 93 (3), S. 180 - 185 (2002)

Dehm, G.; Wagner, T. A.; Balk, T. J.; Arzt, E.; Inkson, B. J.: Plasticity and interfacial dislocation mechanisms in epitaxial and polycrystalline Al films constrained by substrates. Journal of Materials Science & Technology 18 (2), S. 113 - 117 (2002)

Kobrinsky, M. J.; Dehm, G.; Thompson, C. L.; Arzt, E.: Effects of thickness on the characteristic length scale of dislocation plasticity in Ag thin films. Acta Materialia 49 (17), S. 3597 - 3607 (2001)