Suchergebnisse

Eiper, E.; Martinschitz, K. J.; Dehm, G.; Kečkéš, J.: Size effect in metallic thin films characterized by low-temperature X-ray diffraction. 55th Annual Denver X-ray Conference, Denver, CO, USA (2006)

Kirchlechner, C.; Imrich, P. J.; Grosinger, W.; Kapp, M. W.; Kečkéš, J.; Micha, J.-S.; Ulrich, O.; Thomas, O.; Labat, S.; Motz, C. et al.; Dehm, G.: Expected and unexpected plastic behavior at the micron scale: An in situ µLaue tensile study, Acta Materialia 60, S. 1252 - 1258 (2012)