Publikationen von Peter Joachim Konijnenberg

An, D.; Konijnenberg, P. J.; Zaefferer, S.; Raabe, D.: Correlation between the 5-parametric GBCD and the corrosion resistance of a 304 stainless steel by 3D-EBSD. RMS-EBSD Meeting 2016, Manchester, UK (2016)

Mandal, S.; Pradeep, K. G.; Zaefferer, S.; Konijnenberg, P. J.; Raabe, D.: Linking crystallography with property: towards comprehensive characterization of grain boundaries. ICOTOM 17, Dresden, Germany (2015)

Konijnenberg, P. J.; Zaefferer, S.; Raabe, D.: GND Analysis of a Copper Micro Cantilever Beam. MSE 2014, Darmstadt, Germany (2014)

Stechmann, G.; Zaefferer, S.; Konijnenberg, P. J.; Raabe, D.; Gretener, C.; Kranz, L.; Perrenoud, J.; Bücheler, S.; Tiwari, A. N.: 3-Dimensional Microstructural and Crystallographic Characterization of CdTe Absorber Layers from CdTe/CdS Solar Cells Grown in Substrate Configuration. E-MRS, European Materials Research Society Conference 2014 , Lille, France (2014)

Konijnenberg, P. J.; Zaefferer, S.: GND Analysis of a Copper Micro Cantilever Beam. RMS EBSD 2014, London, UK (2014)

Konijnenberg, P. J.; Stechmann, G.; Zaefferer, S.; Raabe, D.: Advances in Analysis of 3D Orientation Data Sets Obtained by FIB-EBSD Tomography. 2nd International Congress on 3D Materials Science 2014, Annecy, France (2014)

Konijnenberg, P. J.; Zaefferer, S.; Raabe, D.: GND Analysis of a Copper Micro Cantilever Beam. Arbeitskreis EBSD 2014, Düsseldorf, Germany (2014)

Konijnenberg, P. J.; Khorashadizadeh, A.; Zaefferer, S.; Raabe, D.: Analysis of 3D-EBSD Datasets Obtained by FIB Tomography. Microscopy and Microanalysis 2013, Indianapolis, IN, USA (2013)

Zaefferer, S.; Elhami, N. N.; Konijnenberg, P. J.; Jäpel, T.: Quantitative Microstructure Characterization by Application of Advanced SEM-Based Electron Diffraction Techniques. Microscopy and Microanalysis 2013, Indianapolis, IN, USA (2013)

Zaefferer, S.; Konijnenberg, P.; Ram, F.; Raabe, D.: Observation of geometrically necessary dislocation arrangements at individual grain boundaries deformed in constraint micro bending tests. GDRi CNRS MECANO General Meeting on the Mechanics of Nano-Objects, MPIE, Düsseldorf, Germany (2013)

Zaefferer, S.; Konijnenberg, P. J.; Khorashadizadeh, A.; Raabe, D.: Analysis of Grain Boundaries in ECAP-Cu observed by 3D-EBSD. RexGG 2013, Sydney Australia (2013)

Zaefferer, S.; Konijnenberg, P. J.: Advanced analysis of 3D EBSD data obtained from FIB-EBSD tomography. RexGG pre-conference workshop, Wollongong, Australia (2013)

Konijnenberg, P. J.; Khorashadizadeh, A.; Zaefferer, S.; Raabe, D.: Analysis of Grain Boundaries by 3D-EBSD in ECAP-Cu. RMS EBSD 2013, Oxford, UK (2013)

Konijnenberg, P. J.; Khorashadizadeh, A.; Stechmann, G.; Zaefferer, S.; Raabe, D.: Challenges and Opportunities in the Analysis of 3D-EBSD datasets. European Congress for Stereology 2013, Kaiserslautern, Germany (2013)

Konijnenberg, P. J.; Khorashadizadeh, A.; Stechmann, G.; Zaefferer, S.; Raabe, D.: Challenges and Opportunities in the Analysis of 3D-EBSD datasets. Scandem 2013, Copenhagen, Demark (2013)

Konijnenberg, P. J.; Khorashadizadeh, A.; Zaefferer, S.; Raabe, D.: Challenges and Opportunities in the Analysis of 3D-EBSD datasets. 22nd GLADD Meeting, Düsseldorf, Germany (2013)

Konijnenberg, P. J.; Stechmann, G.; Zaefferer, S.: Comprehensive, 5-parameter crystallographic grain boundary characterization and its application to thin-film CdTe solar cells. IDSC 2013, Düsseldorf, Germany (2013)

Konijnenberg, P.; Khorashadizadeh, A.; Zaefferer, S.; Raabe, D.: Data mining of 3D EBSD data sets. Inauguration of new FIB-SEM instrument at LETAM, Metz, France (2012)

Konijnenberg, P. J.; Zaefferer, S.; Raabe, D.: Advanced analysis of 3D EBSD data obtained by FIB tomography. NVvM 2012 Materials Science Meeting, Eindhoven, The Netherlands (2012)

Zaefferer, S.; Konijnenberg, P.; Khorashadizadeh, A.; Chen, J.: Advanced analysis of 3D EBSD data obtained from FIB-EBSD tomography. Microscopy & Microanalysis 2012, Phoenix, AZ, USA (2012)