Suchergebnisse

Frommert, M.; Gottstein, G.: Mechanical behavior and microstructure evolution during steady-state dynamic recrystallization in the austenitic steel 800H. Materials Science and Engineering A 506, S. 101 - 110 (2009)

Gross, M.; Varnik, F.; Raabe, D.: Fall and rise of small droplets on rough hydrophobic substrates. Europhysics Letters 88 (26002), S. 26002-p1 - 26002-p6 (2009)

Gutierrez-Urrutia, I.; Zaefferer, S.; Raabe, D.: Electron channeling contrast imaging of twins and dislocations in twinning-induced plasticity steels under controlled diffraction conditions in a scanning electron microscope. Scripta Materialia 61, S. 737 - 740 (2009)

Hamou, R. F.; Macdonald, J. R.; Tuncer, E.: Dispersive dielectric and conductive effects in 2D resistor-capacitor networks. Journal of Physics-Condensed Matter 21 (2), 025904 (13pp) (2009)

Henke, B.; Paßlick, C.; Keil, P.; Johnson, J. A.; Schweizer, S.: Eu oxidation state in fluorozirconate-based glass ceramics. Journal of Applied Physics 106, 113501 (6pp) (2009)

Hickel, T.; Dick, A.; Grabowski, B.; Körmann, F.; Neugebauer, J.: Steel design from fully parameter-free ab initio computer simulations. Steel Research International 80, S. 4 - 8 (2009)

Imlau, J.; Bleck, W.; Zaefferer, S.: Comparison of damage development in dependence of the local microstructure in low alloyed Al-TRIP-steels, IF steel and a DP steel. Int. J. Materials Research 100, S. 584 - 593 (2009)

Jiménez, J.A.; Carsi, M.; Ruano, O.A.; Frommeyer, G.: Effect of testing temperature and strain rate on the transformation behaviour of retained austenite in low-alloyed multiphase steel. Materials Science and Engineering A 508, S. 195 - 199 (2009)

Keerthika, B.; Cao, Y. P.; Raabe, D.: Mechanical characterization of viscoelastic-plastic soft matter using spherical indentation. CMC - Computers, Materials, & Continua 10, S. 243 - 258 (2009)

Keil, P.; Lützenkirchen-Hecht, D.: Surface-sensitive reflection-mode EXAFS from layered sample systems: The influence of surface and interface roughness. J. Synchrotron Rad. 16, S. 443 - 443 (2009)

Kiener, D.; Motz, C.; Dehm, G.; Pippan, R.: Overview on established and novel FIB based miniaturized mechanical testing using in-situ SEM. International Journal of Materials Research 100 (8), S. 1074 - 1087 (2009)

Klüppel, I.; Schinkinger, B.; Grundmeier, G.: In-situ Electrochemical Studies of Forming Induced Defects of Organic Coatings on Metals. Electrochim. Acta 54 (13), S. 3553 - 3560 (2009)

Kobayashi, S.; Tsukamoto, Y.; Takasugi, T.; Chinen, H.; Omori, T.; Ishida, K.; Zaefferer, S.: Determination of phase equilibria in the Co-rich Co–Al–W ternary system with a diffusion-couple technique. Intermetallics 17 (12), S. 1085 - 1089 (2009)

Kong, Q.P.; Jiang, W.B.; Shi, Y.; Cui, P.; Fang, Q.F.; Winning, M.: Grain boundary internal friction in bicrystals with different misorientations. Materials Science and Engineering A 521/522, S. 128 - 133 (2009)

Kostka, A.; Coelho, R. S.; dos Santos, J.; Pyzalla, A. R.: Microstructure of friction stir welding of aluminium alloy to magnesium alloy. Scripta Materialia 60, S. 953 - 956 (2009)

Kumar, P.; Kassner, M. E.; Blum, W.; Eisenlohr, P.; Langdon, T. G.: New observations on high-temperature creep at very low stresses. Materials Science and Engineering A 510-511, S. 20 - 24 (2009)

Kundu, S.; Nagaiah, T.C.; Xia, W.; Wang, Y. M.; Van Dommele, S.; Bitter, J. H.; Santa, M.; Grundmeier, G.; Bron, M.; Schuhmann, W. et al.; Muhler, M.: Electrocatalytic Activity and Stability of Nitrogen-Containing Carbon Nanotubes in the Oxygen reduction Reaction. J. Phys. Chem. C 113 (32), S. 14302 - 14310 (2009)

Liu, T.; Raabe, D.: Influence of nitrogen doping on growth rate and texture evolution of chemical vapor deposition diamond films. Applied Physics Letters 94, 021119 (3pp) (2009)

Lymperakis, L.; Friák, M.; Neugebauer, J.: Atomistic calculations on interfaces: Bridging the length and time scales. The European Physics Journal Special Topics 177, S. 41 - 57 (2009)

Mardare, A. I.; Hassel, A. W.: Quantitative optical recognition of highly reproducible ultra thin oxide films in microelectrochemical anodisation. Rev. Sci Instrum. 80, S. 046106-1 - 046106-3 (2009)