Publikationen von Eduard Arzt

Sonnweber-Ribic, P.; Gruber, P. A.; Dehm, G.; Strunk, H. P.; Arzt, E.: Kinetics and driving forces of abnormal grain growth in thin Cu films. Acta Materialia 60 (5), S. 2397 - 2406 (2012)

Riethmüller, J.; Dehm, G.; Affeldt, E. E.; Arzt, E.: Microstructure and mechanical behavior of Pt-modified NiAl diffusion coatings. International Journal of Materials Research 97 (6), S. 689 - 698 (2006)

Legros, M.; Kaouache, B.; Gergaud, P.; Thomas, O.; Dehm, G.; Balk, T. J.; Arzt, E.: Pipe-diffusion ripening of Si precipitates in Al-0.5% Cu-1%Si thin films. Philosophical Magazine 85 (30), S. 3541 - 3552 (2005)

Girgsdies, F.; Ressler, T.; Wild, U.; Wübben, T.; Balk, T. J.; Dehm, G.; Zhou, L.; Günther, S.; Arzt, E.; Imbihl, R. et al.; Schlögl, R.: Strained thin copper films as model catalysts in the materials gap. Catalysis Letters 102 (1-2), S. 91 - 97 (2005)

Kauffmann, F.; Ji, B.; Dehm, G.; Gao, H.; Arzt, E.: A quantitative study of the hardness in a superhard nanocrystalline titanium nitride/silicon nitride coating. Scripta Materialia 52 (12), S. 1269 - 1274 (2005)

Dehm, G.; Edongué, H.; Wagner, T. A.; Oh, S. H.; Arzt, E.: Obtaining different orientation relationships for Cu films grown on (0001) α-Al₂O₃ substrates by magnetron sputtering. Zeitschrift für Metallkunde 96 (3), S. 249 - 254 (2005)

Kauffmann, F.; Dehm, G.; Schier, V.; Schattke, A.; Beck, T.; Lang, S.; Arzt, E.: Microstructural size effects on the hardness of nanocrystalline TiN/amorphous-SiN_x coatings prepared by magnetron sputtering. Thin Solid Films 473 (1), S. 114 - 122 (2005)

Sauter, L. X.; Balk, T. J.; Dehm, G.; Nucci, J.; Arzt, E.: Hillock Formation and Thermal Stresses in Thin Au Films on Si Substrates. Materials Research Society Symposium Proceedings 875, O5.2, S. 177 - 182 (2005)

Wellner, P.; Dehm, G.; Kraft, O.; Arzt, E.: Size effects in the plastic deformation of NiAl thin films. Zeitschrift für Metallkunde 95 (9), S. 769 - 778 (2004)

Weller, M.; Clemens, H.; Haneczok, G.; Dehm, G.; Bartels, A.; Bystrzanowski, S.; Gerling, R. W.; Arzt, E.: Mechanical Spectroscopy of a High Nb Containing γ-TiAl Based Alloy with Near Gamma and Fully Lamellar Microstructure. Philosophical Magazine Letters 84 (6), S. 383 - 393 (2004)

Wellner, P.; Kraft, O.; Dehm, G.; Andersons, J.; Arzt, E.: Channel cracking of β-NiAl thin films on Si substrates. Acta Materialia 52 (8), S. 2325 - 2336 (2004)

Schmidt, T.; Balk, T. J.; Dehm, G.; Arzt, E.: Influence of tantalum and silver interlayers on thermal stress evolution in copper thin films on silicon substrates. Scripta Materialia 50 (6), S. 733 - 737 (2004)

Dehm, G.; Balk, T. J.; von Blanckenhagen, B.; Gumbsch, P.; Arzt, E.: Dislocation dynamics in sub-micron confinement: recent progress in Cu thin film plasticity. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques 93 (5), S. 383 - 391 (2002)

Dehm, G.; Wagner, T. A.; Balk, T. J.; Arzt, E.; Inkson, B. J.: Plasticity and interfacial dislocation mechanisms in epitaxial and polycrystalline Al films constrained by substrates. Journal of Materials Science & Technology 18 (2), S. 113 - 117 (2002)

Kobrinsky, M. J.; Dehm, G.; Thompson, C. L.; Arzt, E.: Effects of thickness on the characteristic length scale of dislocation plasticity in Ag thin films. Acta Materialia 49 (17), S. 3597 - 3607 (2001)

Vogel, M.; Kraft, O.; Dehm, G.; Arzt, E.: Quasi-crystalline grain-boundary phase in the magnesium die- cast alloy ZA85. Scripta Materialia 45 (5), S. 517 - 524 (2001)

Chatterjee, A.; Clemens, H.; Mecking, H.; Dehm, G.; Arzt, E.: Creep behavior of γ-TiAl-based alloys with fully lamellar microstructure. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques 92 (8), S. 1000 - 1004 (2001)

Dehm, G.; Weiss, D.; Arzt, E.: In situ transmission electron microscopy study of thermal-stress-induced dislocations in a thin Cu film constrained by a Si substrate. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing 309-310, S. 468 - 472 (2001)

Legros, M.; Dehm, G.; Keller-Flaig, R.-M.; Arzt, E.; Hemker, K. J.; Süresh, S.: Dynamic observation of Al thin films plastically strained in a TEM. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing 309-310, S. 463 - 467 (2001)

Arzt, E.; Dehm, G.; Gumbsch, P.; Kraft, O.; Weiss, D.: Interface controlled plasticity in metals: dispersion hardening and thin film deformation. Progress in Materials Science 46 (3-4), S. 283 - 307 (2001)