Publications of  Interface Spectroscopy Group

Hamou, F. R.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical analysis of Debye screening effect in electrode surface potential mapping by scanning electrochemical potential microscopy. Electrochemistry Communucations 12 (10), pp. 1391 - 1394 (2010)

Chen, Y.; Milenkovic, S.; Hassel, A. W.: Reactivity of Gold Nanobelts with Unique {110} Facets. A European Journal of Chemical Physics and Physical Chemistry 11 (13), pp. 2838 - 2843 (2010)

Hamou, F. R.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy. Electrochimica Acta 55 (18), pp. 5210 - 5222 (2010)

Hassel, A. W.; Bello-Rodriguez, B.; Smith, A. J.; Chen, Y.; Milenkovic, S.: Preparation and specific properties of single crystalline metallic nanowires. Physica Status Solidi B 247, pp. 2380 - 2392 (2010)

Reithmeier, M.; Erbe, A.: Dielectric interlayers increasing the transparency of metal films for mid-infrared attenuated total reflection spectroscopy. Physical Chemistry Chemical Physics 12, pp. 14798 - 14803 (2010)

Xu, Y.; Chen, Y.; Wu, J.; Li, D.; Ju, H.; Zheng, J.: The determination of the kinetic parameters of electrochemical reaction in chemical power sources: A critical review. International Journal of Hydrogen Energy 35, pp. 6366 - 6380 (2010)

Zuo, J.; Erbe, A.: Optical and electronic properties of native zinc oxide films on polycrystalline Zn. Phys. Chem. Chem. Phys. 12 (37), pp. 11467 - 11476 (2010)

Erbe, A.; Sigel, R.: Ellipsometric light scattering to probe the interface of colloids - Current applications and future challenges. In: European Physical Journal - Web of Conferences, 02001, p. 5 p.. API'09 - First NanoCharM Workshop on Advanced Polarimetric Instrumentation, Palaiseau, France, December 07, 2009 - December 09, 2009. (2010)

Reithmeier, M.; Erbe, A.: Antireflective Layers on Thin Metal Films for Mid-Infrared Internal Reflection Spectroscopy. In: Optical Interference Coatings (OIC), pp. 1 - 3. Measurement III (ThE), Tucson, AZ, USA, June 06, 2010. Optical Society of America (OSA), Washington, D.C., USA (2010)

Wu, X.; Erbe, A.; Fabritius, H.; Raabe, D.: Spectral and angular distribution of light scattered from the elytra of two carabid beetle species. API'09 - First NanoCharM Workshop on Advanced Polarimetric Instrumentation, Palaiseau, France, December 07, 2009 - December 09, 2009. EPJ Web of Conferences 5, 02007, (2010)

Wu, X.; Erbe, A.; Fabritius, H.; Raabe, D.: Relation of ultrastructure and optical properties in the cuticle of beetles. Materials Science and Engineering MSE 2010, Darmstadt, Germany (2010)

Reithmeier, M.; Erbe, A.: Antireflective layers on thin metal films for mid‐infrared internal reflection spectroscopy. Optical Interference Coatings - Topical Meeting, Tucson, Arizona, USA (2010)

Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical Investigation of Electrode Surface Potential Mapping with Scanning Electrochemical Potential Microscopy. The 12th International Scanning Probe Microscopy Conference, Sapporo, Japan (2010)

Reithmeier, M.; Vasan, G.; Erbe, A.: Optical engineering of interfaces for concurrent internal reflection infrared-spectroscopic and electrochemical applications. 109th Annual meeting of the German Bunsen Society of Physical Chemistry (Bunsentagung), Bielefeld, Germany (2010)

Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical simulation of probing the electric double layer by scanning electrochemical Potential microscopy. 217th ECS Meeting, Vancouver, Canada (2010)

Reithmeier, M.; Erbe, A.: Dielectric layers for signal enhancement in ATR spectroscopy. Spring meeting of the German Physical Society, Regensburg, Germany (2010)

Vasan, G.; Erbe, A.: Finite element calculations of surface enhancement in attenuated total reflection infrared spectroscopy. Spring meeting of the German Physical Society, Regensburg, Germany (2010)

Vasan, G.; Erbe, A.: Finite element calculations of surface enhancement in attenuated total reflection infrared spectroscopy. Workshop Nano particles, nano structures and near field computation, Bremen, Germany (2010)

Chen, Y.; Zuo, J.; Schneider, P.; Erbe, A.: Real-time investigation of ZnO growth on Zn by spectroscopic ellipsometry. 3rd NanoCharm Workshop on Non-Destructive Real Time Process Control, Berlin, Germany (2010)

Nayak, S.; Biedermann, P. U.; Erbe, A.: Spectroscopic Investigation of the Oxygen Reduction Reaction (ORR) on Semiconductor Surfaces. Electrochemistry 2010 - From microscopic understanding to global impact, Bochum, Germany (2010)