Accurate Electron Channeling Contrast Imaging (aECCI):
a powerful tool for understanding the fundamental deformation mechanisms of materials.

Successful combination of macroscopic mechanical testing of bulk specimen with a dislocation-scale characterization technique: the accurate Electron Channeling Contrast Imaging (aECCI). aECCI is a non-destructive procedure offering the ability to provide, inside a Scanning Electron Microscope (SEM), TEM-like diffraction contrast imaging of sub-surface defects (at a depth of about one hundred of nanometers) on centimetric bulk specimen with still unsurpassed resolutions.

I. Fundaments on the defect contrasts and the experiment procedure will be presented

II. Full potentiality of aECCI for following the evolution of deformation microstructures will be highlighted in the case of a TiAl based alloy and a β-metastable Ti.

Dr. Antoine Guitton

Tenured Associate Professor of Materials Physics

Université de Lorraine – CNRS – Arts et Métiers ParisTech – LEM3
7 rue Félix Savart
57070 Metz

France

Phone	+33 372 747 787
Email	Dr. A. Guitton
Http	Dr. A. Guitton
	LEM3