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Journal Article (36)
21.
Journal Article
118 (9), 095302 (2015)
Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films. Journal of Applied Physics 22.
Journal Article
107 (17), 172102 (2015)
Detection of Cu2Zn5SnSe8 and Cu2Zn6SnSe9 phases in co-evaporated Cu2ZnSnSe4 thin-films. Applied Physics Letters 23.
Journal Article
115 (15), 154501 (2014)
Investigation of the diffusion behavior of sodium in Cu(In,Ga)Se2 layers. Journal of Applied Physics 24.
Journal Article
115 (10), 103507 (2014)
Origins of electrostatic potential wells at dislocations in polycrystalline Cu(In,Ga)Se2 thin films. Journal of Applied Physics 25.
Journal Article
4 (2), 1300543 (2014)
Cu-Rich Precursors Improve Kesterite Solar Cells. Advanced Energy Materials 26.
Journal Article
534, pp. 62 - 66 (2013)
Extended defects and precipitation in heavily B-doped silicon. Thin Solid Films 27.
Journal Article
74, e50376 (2013)
Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries. Journal of Visualized Experiments 28.
Journal Article
102, 042101, pp. 1 - 4 (2013)
Atom probe study of Cu2ZnSnSe4 thin-films prepared by co-evaporation and post-deposition annealing. Applied Physics Letters 29.
Journal Article
101 (18), pp. 181603-1 - 181603-5 (2012)
Exploring the p-n junction region in Cu(In,Ga)Se2 thin-film solar cells at the nanometer-scale. Applied Physics Letters 30.
Journal Article
2 (8), pp. 992 - 998 (2012)
Confined and chemically flexible grain boundaries in polycrystalline compound semiconductors. Advanced Energy Materials 31.
Journal Article
44 (11-12), pp. 1386 - 1388 (2012)
Compositional gradients and impurity distributions in CuInSe2 thin-film solar cells studied by atom probe tomography. Surface and Interface Analysis 32.
Journal Article
20 (3), pp. 18 - 24 (2012)
Atom-Probe Tomography of compound semiconductors for photovoltaic and light-emitting device applications. Microscopy Today 33.
Journal Article
110 (12), 124513 (7pp) (2011)
Comparative atom probe study of Cu(In,Ga)Se2 thin-film solar cells deposited on soda-lime glass and mild steel substrates. Journal of Applied Physics 34.
Journal Article
1, pp. 207 - 212 (2011)
Characterization of grain boundaries in Cu(In,Ga)Se2 films using atom probe tomography. Journal of Photovoltaics 35.
Journal Article
98, pp. 103504-1 - 103504-3 (2011)
Atomic-scale characterization of the CdS/CuInSe2 interface in thin-film solar cells. Applied Physics Letters 36.
Journal Article
111 (6), pp. 552 - 556 (2011)
Atomic-scale distribution of impurities in CuInSe2-based thin-film solar cells. Ultramicroscopy Book Chapter (1)
37.
Book Chapter
2-2, pp. 523 - 567. wiley, Hoboken, NJ, USA (2016)
Accessing Elemental Distributions in Thin Films for Solar Cells. In: Advanced Characterization Techniques for Thin Film Solar Cells: Second Edition, Vol. Conference Paper (6)
38.
Conference Paper
22, pp. 46 - 47. 3rd Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , Saarbrücken, Germany, October 11, 2016 - October 12, 2016. (2016)
Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT. In: Microscopy and Microanalysis, Vol. 39.
Conference Paper
Interface engineering and nanoscale characterization of Zn(S,O) alternative buffer layer for CIGS thin film solar cells. In: 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015, 7355889. 42nd Photovoltaic Specialist Conference, PVSC 2015, Category numberCFP15PSC-ART; Code 118514, New Orleans, LA, USA, June 14, 2015 - June 19, 2015. Institute of Electrical and Electronics Engineers Inc., Piscataway Township, NJ, USA (2015)
40.
Conference Paper
Cd and impurity redistribution at the p-n junction of CIGS based solar cells resolved by atom-probe tomography. In: Photovoltaic Specialist Conference (PVSC), pp. 1 - 6 (Ed. IEEE ). Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd , New Orleans, LA, USA, June 14, 2015 - June 19, 2015. (2015)