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BEGIN:VEVENT
DTSTAMP:20261002T134233Z
UID:https://www.mpie.de/events/36438/3755656
DTSTART:20240111T130000Z
DTEND:20240111T140000Z
CLASS:PUBLIC
CREATED:20240109T181052Z
DESCRIPTION: Many of the functional materials we hope to leverage for next-
 generation technological applications — such as computing\, energy harve
 sting and storage\, or communication devices — draw their unique and som
 etimes exotic properties from a suite of interactions between the atoms\, 
 spins\, and charges in a crystalline lattice. With direct\, real-space acc
 ess to these order parameters down to the atomic scale\, the scanning tran
 smission electron microscope (STEM) is a powerful tool to probe the fundam
 ental framework of such compounds and their properties. As an example of t
 his\, I will show how advanced STEM techniques can elucidate key questions
  about the landscape of superconductivity in recently discovered nickelate
 s. But many of these functional systems are most useful (and therefore int
 eresting) away from the ambient conditions of most typical high-resolution
  STEM experiments\, for instance at cryogenic or elevated temperatures or 
 under an external bias. It is therefore imperative to expand the environme
 ntal compatibility of these methods through the parallel development of bo
 th hardware and data processing tools\, key examples of which will be high
 lighted here.\nSpeaker: Dr. Berit Goodge 
LAST-MODIFIED:20240115T140651Z
LOCATION:Max-Planck-Institut für Eisenforschung GmbH\, Room: Large Confere
 nce Room No. 203
ORGANIZER;CN=on invitation of Dr. Christian Liebscher  :mailto:
SUMMARY: Structure and spectroscopy at the atomic scale: advanced electron 
 microscopy for improved design of functional materials 
URL;VALUE=URI:https://www.mpie.de/events/36438/3755656
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